Alif Semiconductor /AE302F40C1537LE_CM55_HP_View /OSPI0 /OSPI_RX_SAMPLE_DELAY

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Interpret as OSPI_RX_SAMPLE_DELAY

31 2827 2423 2019 1615 1211 87 43 0 0 0 0 0 0 0 0 00 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0RSD0 (SE)SE

Description

OSPI RX Sample Delay Register

Fields

RSD

RXD Sample Delay. This bit field is used to delay the sample of the RXD input port. Each valuere presents a single OSPI_CLK delay on the sample of RXD. Note: If this bit is programmed with a value that exceeds the depth of the internal shift registers (internal shift register depth = 4) zero delay will be applied to the RXD sample.

SE

RXD Sampling Edge. This bit is used to decide the sampling edge for RXD signal with OSPI_CLK. Then this bit is set to 1 then negative edge of OSPI_CLK will be used to sample the incoming data, otherwise positive edge will be used for sampling.

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